Utilizing SWIR-based Camera Platforms to perform Laser Beam Profiling

Camera-based systems are the norm used for laser beam profiles using pulsed light. Cameras are used to track and measure the beam’s width. The applications of such systems are numerous and varied. Learn more about the benefits of SWIR camera-based laser systems that use SWIR cameras for beam profiling.

The advantages of silicon-based Optical Systems

Silicon-based charge-coupled devices and silicon-based complementary metal-oxide-semiconductors (e.g. CCDs or CMOS) are often used in high-performance imaging and can detect wavelengths that extend from soft xrays to near-infrared (NIR). In general the quantum efficacy of CCDs diminishes rapidly as the wavelength of detection increases further into that NIR range. In wavelengths that exceed 1100 nm,using conventional CCDs and CMOS system light cannot be absorbed by a silicon crystal since the photons in this kind of light lack enough energy to cause the electron to leap.

The latter type features large area sensors with the highest resolution. It is essential for obtaining accurate measurements of small and massive laser beams. Both types of profilers measure wavelengths ranging from UV through near-infrared (IR). 

SWIR Vision Systems has an exclusive series of cameras which feature 800-1,700 nm sensor band for laser beam profiling based upon colloidal quantum dots (CQD) thin film photodiodes made in a single piece out of quartz wafers for reading. They are able to achieve in SWIR imaging what CMOS image sensors as well as micro-bolometer arrays have achieved for visible and longwave imaging as well as visible infrared imaging. CQD laser imaging sensor SWIR are available in both camera-based as well as camera-less variants.

Prior to making a decision regarding the detector to use,one must consider every aspect of the application,including how wavelengths respond.

Selecting an optical device for applied pulsed laser beam measurement

Regarding the use of this technology,there’s no one-size-fits all profiler,as various lasers have different wavelengths. Additionally,the lasers are equipped with different beam sizes as well as power levels,meaning they require different optical systems. Optical systems must be equipped with wavelength-specific attenuators,as well as antireflective coatings in order to precisely determine the spectrum. These differences introduce errors into measuring processes.

Camera-based systems for laser beams profiling are the most commonly used option for large beam measurement. These systems employ the CMOS or photodiode-based detector to identify the wavelength. In reality,cameras-based systems can be utilized in many different ways that include industrial applications,studies and research,as well as for military purposes.

Camera-based systems that use the pulsed beam profiler have many advantages over slit-based devices. Slit-based systems permit the measurement of very small beams directly,while camera-based systems can detect both unfocused and concentrated beams. They are especially beneficial in factory floor applications in which accuracy and reliability are essential.

Camera-based systems that use pPulsed lLaser beam pProfilers can be highly sensitive to the effects of low-linewidth laser beams. These artifacts can be eliminated by meticulous optical design.

Camera-based systems are the ideal choice for a wide range of applications.The cameras that are used for pulsed laser beam profiling are typically C-mount compatible. The camera head itself doesn’t have a faceplate on the front of the chip that is used for sensor and there’s no requirement to purchase a separate ND filter (the filters block any light that is not directed towards on the chip).

Unlike conventional laser beam measurements,which require a lens with a fixed aperture in order to view a beam,Acuros CDQ Sensors can laser beam profile either with or without cameras. Cameras are not always suitable for large-beam applications since it’s not able to detect beams with smaller dimensions.

Applications

The uses of SWIR Laser Profiling are numerous. The measurements can be used for a wide range of processes such as laser collimation and characterisation. There are many advantages to using a CCD beam profiler for instance its ability to measure astigmatism as well as its ability to translate along the beam path. For instance an CCD beam profiler can measure the degree of astigmatism in a laser beam that is essential for measuring astigmatism in medical imaging. Moreover beam profilers using CCD can determine astigmatism even without a cover glass. Furthermore,the lack of a cover glass is a significant characteristic of a CCD beam profiler. Although a CCD camera might not be suitable for all applications but it is often the best choice for SWIR laser beam monitoring,depending on the application at hand.